THIN FILM MICROCIRCUIT INTERCONNECTIONS.

Abstract

Two patterns for interfacial interconnections and one pattern for the electrically insulating crossovers were designed. Masks were fabricated for these patterns which make possible, in a single deposition sequence, the fabrication of 440 interfacial interconnections or 1512 insulating crossovers. Processing specifications for the deposition of chromium-gold, chromium, and aluminum were established. A measurement technique and procedure were devised and proven for the accurate measurement of small D. C. voltages. Interfacial interconnections of the combinations chromium over chromium-gold, chromium-gold over chromium, chromium-gold over chromium-gold, aluminum over chromium-gold, and aluminum over chromium, were fabricated, tested, and evaluated. A qualitative estimate of the interfacial resistance corresponding to these conductor combinations was made. Preliminary adhesion tests were performed. (Author)

Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1966
Accession Number
AD0628577

Entities

People

  • H. M. Greenhouse
  • I. G. Goldsmith
  • J. F. Bass
  • T. H. Yaffe
  • W. W. Richardson

Tags

DTIC Thesaurus Topics

  • Adhesion
  • Aluminum
  • Chromium
  • Elements
  • Fabrication
  • Films
  • Measurement
  • Metals
  • Microcircuits
  • Resistance
  • Sequences
  • Specifications
  • Thin Films

Readers

  • Integrated Circuit Design and Technology.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene
  • Microelectronics - Microelectromechanical Systems