ON THE MEANING OF THE FAULT PARAMETERS MEASURED BY X-RAYS; I. STRAIN DISTRIBUTIONS IN SHOCK-LOADED SINGLE CRYSTALS OF COPPER; II.

Abstract

A comparison was made between the intensity of twin faults seen in the electron microscope and the effects on the diffraction pattern of a single crystal of copper shock-loaded at 435 kb. The Fourier coefficients of peaks like the (111), (222), (444) and (555) are effected by twin faults and that those of the (333) are not. From this fact the twin fault density can be calculated and compared with the electron microscopic results. Excellent agreement was obtained. The strain distributions in shockloaded copper was shown to be Gaussian. (Author)

Document Details

Document Type
Technical Report
Publication Date
Feb 15, 1966
Accession Number
AD0628957

Entities

People

  • Jerome B. Cohen
  • R. J. De Angelis

Organizations

  • Northwestern University

Tags

DTIC Thesaurus Topics

  • Agreements
  • Coefficients
  • Crystals
  • Diffraction
  • Electron Microscopes
  • Electrons
  • Intensity
  • Microscopes
  • Optical Equipment
  • Optical Magnification Devices
  • Single Crystals
  • X Rays

Readers

  • Materials Science and Engineering.

Technology Areas

  • Microelectronics