INVESTIGATION OF HIGH POWER GASEOUS ELECTRONICS.
Abstract
An experimental technique is described for obtaining reproducible clean-up measurements in high power microwave duplexer discharges under controlled conditions. A basic clean-up rate is defined as the number of molecules sorbed per cc of discharge area per square root of average incident power. Data is given for the clean-up of inert gases in quartz; hydrogen in 7070 glass, quartz, copper, nickel, molybdenum and kovar; and oxygen and bromine in kovar. A technique is outlined for predicting duplexer life time when limited by diffusion controlled clean-up. Life time increases with the square of the gas-volumeto-discharge-area ratio and with the square of the pressure range over which a tube remains operable. Life time is also inversely proportional to peak power and to the square of duty cycle. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1966
- Accession Number
- AD0629537
Entities
People
- H. S. Maddix
Organizations
- M/A-COM Technology Solutions