NOISE MEASUREMENTS AS A TOOL IN ELECTRON DEVICE RESEARCH.
Abstract
Equipment is being assembled for pulse noise measurements in thin film structures, including thin film cathodes. Equipment is also being assembled for noise measurements in transmission secondary emission image intensifier tubes obtained from Westinghouse. Improved techniques for making better, or novel, secondary emission targets have been introduced. Secondary emission noise measurements indicate that eta - delta = var n sub c/<n sub c>, where n sub c is the number of secondaries produced by a given primary, varies as the square root of the primary energy over a rather wide primary energy range. There is therefore only a limited energy range for which var n sub c is congruent to (n sub c). Univac thin film Al203 diodes with about 20 angstrom oxide thickness show 1/f noise, varying as I sub a squared, at low frequencies and full shot noise at higher frequencies. There was no apparent space charge suppression of the noise. Screen noise measurements were performed on the highspeed screen of a 5BNP16 cathode ray tube. A circular scan was used to scan the screen and the light output was detected by a phototube. Both the resulting noise spectrum and the rms deviation from the mean photocurrent were measured. Interesting results were obtained that are not yet fully explained. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 30, 1965
- Accession Number
- AD0629781
Entities
People
- A. Van Der Ziel
Organizations
- University of Minnesota