RADIATION EFFECTS ON (MONOLITHIC) MICROELECTRONIC CIRCUITS.
Abstract
Phase 1 (Circuit Evaluation: Evaluation of radiation effects in available circuits) was initiated during the second quarter with the Linac tests for the evaluation of transient radiation effects in thirty-four types of commercially available microcircuits of the DTL, RTL, and RCTL logic types. An evaluation of the results was made by relating the experimentally measured output voltage responses to the circuit noise margins. The results show, in general, the RCTL circuits are the most sensitive to transient radiation effects, that DTL circuits with internal load resistors are less sensitive than those without resistors, and that low power RTL gates are more sensitive than either the standard RTL gate or the RTL power gate. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1966
- Accession Number
- AD0629948
Entities
People
- A. M. Liebschutz
- C. W. Perkins
- E. P. Mitchell
- R. W. Marshall
Organizations
- Hughes Aircraft Company