MEASUREMENT OF MINORITY CARRIER LIFETIME IN GERMANIUM AND SILICON BY THE SPREADING RESISTANCE PHOTO DECAY METHOD. CALORIMETRIC METHOD OF MEASURING ABSORBED POWER IN ELECTROLUMINESCENCE,

Abstract

The photo-conductive decay of spreading resistance in contact with germanium and silicon of different surface conditions, subjected to photo-excitation of different spectral compositions was studied and a simple method for the measurement of semi-conductor lifetime is presented. The second paper describes the use of calorimetric method to measure electric power absorption in electroluminescence. The method is based on the principle of conservation of energy; therefore, effects of harmonics and frequency in the measurement are eliminated. Preliminary experimental results indicate measurement error for readings under five microwatts (mW) is less than 5%. (Author)

Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1965
Accession Number
AD0630930

Entities

People

  • Chang Kuang-chi
  • Chuang Wei-hua
  • Hsu Shao-hung
  • Pan Kuei-sheng

Organizations

  • United States Army Foreign Science and Technology Center

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Absorption
  • Electric Power
  • Electroluminescence
  • Excitation
  • Frequency
  • Germanium
  • Harmonics
  • Measurement
  • Minority Groups
  • Power
  • Republic
  • Resistance
  • Surface Properties

Readers

  • Atmospheric Science / Meteorology, specifically Wind Wave Turbulence.
  • Electronics Engineering
  • Semiconductor Device Technology