OPTICAL STUDIES ON ANODIC OXIDE FILMS ON ALUMINIUM (I/II),
Abstract
OPTICAL ANALYSIS OF THE MECHANISM OF FORMATION OF ALPHA-ALUMINA FILM: Main constituents of the films produced in sodium and potassium bisulphate melts or their mixtures were confirmed to be alpha-Al2O3. The film formed in ammonium bisulphate melt contained an appreciable amount of gamma-alumina. The films formed in conc. H2SO4 or in conc. H2SO4+oleum, consist mainly of gamma-Al2O3, but by longer formation, it was partly converted to alpha-Al2O3. REFRACTIVE INDICES AND DOUBLE REFRACTION OF VARIOUS ANODIC OXIDE FILMS: Anodic oxide films such as oxalic, sulphuric acid films formed at normal anodizing conditions and at lower temperature (hard-coating), chromic, sulphamic, phosphoric, boric (plus sulphuric) acid films, Ematal and Kalcolor films and boric acid-formamide films developed by the authors, were observed under polarizing microscopy and the refractive indices were determined and the existence of doubly-refracting properties was checked. Refractive indices of these films are usually lower than pure crystalline or amorphous alumina (1.67 plus or minus). (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 01, 1966
- Accession Number
- AD0631171
Entities
People
- Tajima Sakae