A PRECISE DETERMINATION OF INTERPLANAR SPACING FROM DIVERGENT BEAM PHOTOGRAPHS.

Abstract

Precise lattice parameter determination by means of the divergent x-ray beam method is simplified by placing a wire grid between film and specimen, and employing a double-exposure technique. Shadows cast by the grid appear as breaks in the ellipses of the pattern. The film coordinates of these breaks are utilized to calculate the d-values of the reflecting planes. (Author)

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1966
Accession Number
AD0631179

Entities

People

  • A. Shrier
  • S. Weissmann
  • Z. H. Kalman

Organizations

  • Rutgers University–New Brunswick

Tags

Communities of Interest

  • Air Platforms

DTIC Thesaurus Topics

  • Electromagnetic Radiation
  • Grids
  • Images
  • Ionizing Radiation
  • Photographic Images
  • Photographic Materials
  • Photographs
  • Photography
  • X Rays

Fields of Study

  • Physics

Readers

  • Computer Vision.
  • Materials Science and Engineering.
  • Nanofabrication and Microfabrication.

Technology Areas

  • Space
  • Space - Orbital Debris