MICROCIRCUIT RELIABILITY PREDICTION METHODS.

Abstract

A survey of possible test methods, and some exploratory work, showed that the most promising methods for the reliability screening of microcircuits are conventional electrical tests; special electrical tests such as rf noise measurement and use of the ring-counter technique; infrared temperature measurement; and visual inspection. (Author)

Document Details

Document Type
Technical Report
Publication Date
Mar 11, 1966
Accession Number
AD0631972

Entities

People

  • H. F. Dean

Organizations

  • Navy Electronics Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Inspection
  • Measurement
  • Microcircuits
  • Reliability
  • Test Methods
  • Visual Inspection

Readers

  • Atmospheric Remote Sensing.
  • Integrated Circuit Design and Technology.
  • Regression Analysis.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems