A CINEPHOTOMICROGRAPHIC STUDY OF DYNAMIC DISLOCATION PHENOMENA IN CRYSTALS.

Abstract

A brief summary is presented of the investigations performed during specific studies were made of the indentation hardness of various crystals, certain dislocation phenomena in ionic crystals, and surface damage in semiconductor crystals. Experimental techniques employed in these studies included dislocation etch pitting, optical microscopy, and X-ray diffraction microscopy. Notes on the principal findings are presented. (Author)

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1966
Accession Number
AD0632554

Entities

People

  • Louis J. Demer

Organizations

  • University of Arizona

Tags

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Crystals
  • Diffraction
  • Dislocations
  • Electronics
  • Hardness
  • Ionic Crystals
  • Microscopy
  • Semiconductors
  • Solid State Electronics
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene