DIFFUSE DOUBLE DIFFRACTION OF X-RAYS.
Abstract
A Monte Carlo method has been used to evaluate the magnitude of twice scattered x-rays in diffraction experiments. The quantitative effects of variations in the primary scattering distribution, the absorption coefficient, the scattering power of the atoms, the x-ray wavelength, the specimen thickness, the monochromator and slit configuration and of polarization corrections have been derived. These factors have various influences on the magnitude and angular distribution of the twice scattered radiation.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 06, 1966
- Accession Number
- AD0633051
Entities
People
- Roy Kaplow
- S. L. Strong
Organizations
- Massachusetts Institute of Technology