HIGH SPEED SEMICONDUCTOR SWITCH (TWO TERMINAL) AND HIGH SPEED SEMICONDUCTOR SWITCH (GATE).

Abstract

The report presents results obtained from preproduction testing of a 2N1765 device lot, solutions to problems involving leakage current, dv/dt, and turn-on time, and descriptions of work performed on life test facilities. (Author)

Document Details

Document Type
Technical Report
Publication Date
Feb 28, 1966
Accession Number
AD0633141

Entities

Organizations

  • Motorola Mobility

Tags

DTIC Thesaurus Topics

  • Buildings And Structures
  • Compound Semiconductors
  • Electronics
  • Engineering
  • Life Tests
  • Production
  • Production Engineering
  • Production Management Methods
  • Productivity
  • Semiconductors
  • Solid State Electronics
  • Terminals
  • Test Facilities

Readers

  • Aerospace Test and Evaluation
  • Electrical Engineering

Technology Areas

  • Microelectronics