EVALUATION OF THE STRUCTURE AND STRENGTH OF GLASS-DRAWN COPPER MICROWIRE.
Abstract
A size dependence was found in the strength of glass drawn copper microwires, and the finest wires, near 1 micron in diameter, showed the highest strength. Allowing for systematic errors in the measurement of the areas of cross sections of tension specimens, there is sufficient evidence indicating that the finest wires are capable of strengths above 200 ksi. Although most of the copper microwires in the larger size range, 6- 16 microns, showed strengths near 100 ksi, a few showed strengths near 40 ksi. This is contrasted with the near 30 ksi strength found in annealed, polycrystalline bulk copper; hence, strength then could be related to degree of crystalline perfection. The x-ray diffraction data on a bundle of parallel larger size copper microwires indicates strongly the presence of preferred orientation, and therefore, a preferred growth direction. In view of the process used in producing the glass-drawn microwires and their unusually high strength capability, it is concluded that the wires can be grown in the form of almost continuous single crystals with few dislocations present. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 30, 1966
- Accession Number
- AD0633213