INTEGRATED LOGIC NETS.

Abstract

Investigations have been conducted into the technology necessary to interconnect arrays of n- and p-type MOS transistors into complementary-symmetry digital circuits. A memory module consisting of four n-type and four p-type transistors was chosen as the test vehicle. It is shown that first-level wiring on each array requires a blanket insulation between one and two microns thick to reduce wiring capacitance, and a scheme is described whereby access holes through any vacuum-deposited insulator may be obtained. The interconnection of the n-type and p-type arrays is accomplished by evaporating solder dots at appropriate points on each array, placing the arrays face-to-face, and heating in a reducing atmosphere to produce solder connections. Alignment is accomplished by looking through the silicon wafers with an infrared-to-visible light converter; the wafers are illuminated from below with a Sun Gun which also serves as the heat source when intensity is increased. (Author)

Document Details

Document Type
Technical Report
Publication Date
May 01, 1966
Accession Number
AD0633288

Entities

People

  • Adolph K. Rapp

Organizations

  • RCA Corporation

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Atmospheres
  • Capacitance
  • Circuits
  • Converters
  • Dielectrics
  • Digital Circuits
  • Electronic Equipment
  • Insulation
  • Intensity
  • Symmetry
  • Test Vehicles
  • Transistors
  • Vehicles
  • Visible Spectra

Readers

  • Image Processing and Computer Vision.
  • Integrated Circuit Design and Technology.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems