MEASUREMENTS OF MINORITY-CARRIER LIFETIME IN AN N-TYPE DIFFUSED SKIN,

Abstract

A modified photoconductivity method was used to measure the minority-carrier lifetime in an n-type, diffused skin. The measurements show the lifetime to be a function of surface conditions. The samples were exposed to gases, treated with etches, and subjected to abrasion. The effect of these treatments on the minority-carrier lifetime is compared with their effect on P-N-P germanium transistors. A short theoretical study of the measuring procedure is also included. (Author)

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1966
Accession Number
AD0633955

Entities

People

  • Robert J. Anstead

Organizations

  • Harry Diamond Laboratories

Tags

DTIC Thesaurus Topics

  • Abrasion
  • Germanium
  • Measurement
  • Minority Groups
  • Photoconductivity
  • Surface Properties
  • Transistors

Fields of Study

  • Materials science

Readers

  • Reinforced Composite Materials
  • Semiconductor Device Technology