ON THE FORMATION OF OXIDE FILMS ON ALUMINUM.
Abstract
Aluminum specimens provided with different types of oxide films were investigated for the purpose of obtaining a new insight into the mechanism of development of the oxide films. It was desirable here to carry out the measurements on optimum defined layers with optimum absence of impurities. This requirement was best satisfied, as found from a comparison of aluminum of different degrees of purity, by Erftal, a 99.9-% pure commercial grade. Comparison of different measuring methods and the preparation of specimens of known barrier-layer thickness determined that the latter can be measured through capacitance of the specimens and independently of the possible existence of a cover layer. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1966
- Accession Number
- AD0635687
Entities
People
- W. Kaden