MICROMODULE LIFE TEST PROGRAM.

Abstract

Progress is reported on a micromodule life test program to determine the Mean-Time-To-Failure (MTTF) of a typical analog and a typical digital micromodule when tested for ten-thousand (10,000) hours under load at elevated temperature. The causes of micromodule failure during test are to be determined and reported to each supplier of test modules, and at the conclusion of testing, drift characteristics of each micromodule parameter are to be studied to determine attainable tolerance limits for these parameters.

Document Details

Document Type
Technical Report
Publication Date
Apr 15, 1966
Accession Number
AD0636283

Entities

People

  • F. E. Farmer

Tags

DTIC Thesaurus Topics

  • Life Tests

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