STUDY OF NOISE IN SEMICONDUCTOR DEVICES.
Abstract
The report presents the progress of experimental and theoretical investigation of noise in solid state devices such as transistors, junction and MOS FET's, PIN diodes, junction laser diodes and the like. The noise properties of microwave transistors, transistor noise at high injection levels, and transistor 1/f noise at elevated temperatures are studied in particular.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 1966
- Accession Number
- AD0636324
Entities
People
- A. Van Der Ziel
Organizations
- University of Minnesota