A METHOD OF REMOVING THE SURFACE FILM FORMED AFTER THE DIFFUSION OF BORON ON THE SURFACE OF SILICON.

Abstract

In using B2O3 as an impurity source to form a P-N bond by diffusion on the surface of a N-type silicon sheet, a thin layer of a blue or dark gray film will be formed if the temperature of diffusion is too high and the time is too long. A simple electrolytic method of removing that surface film is proposed. It destroys the film formed on the surface of silicon after diffusion without corroding the silicon itself.

Document Details

Document Type
Technical Report
Publication Date
May 09, 1966
Accession Number
AD0637067

Entities

People

  • Cheng-sung Huang

Organizations

  • National Air and Space Intelligence Center

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Diffusion
  • Impurities

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology
  • Surface Engineering/Surface Coating Technology.