NOISE MEASUREMENTS AS A TOOL IN ELECTRON DEVICE RESEARCH.
Abstract
The first part of the report reproduces published papers whereas the second part deals with unpublished research. The published papers deal with: (1) Apparent noise suppression in thin-film diodes caused by traps; (2) Noise suppression in space-charge-limited field-emission cathodes; (3) A Hanbury Brown-Twiss type circuit for measuring small noise signals against a large noise background; (4) Noise in cathodoluminescence light; (5) Noise in the light emission and electron emission of MgO cold emitters; (6) Noise in field-emission diodes. The unpublished research deals with noise in secondary electron emission, in thin-film cathodes and thin-film devices and in transmission-type secondary emission. The equivalence of the particle and the wave picture of photon noise is shown. Finally there is a section on noise in the light output of a scanned cathoderay tube screen caused by screen inhomogeneities. For the experimental set-up used here the r.m.s. fluctuation in light intensity amounts to a few percent and the noise spectrum extends to about 50 kc/s. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 31, 1966
- Accession Number
- AD0638297
Entities
People
- A. Van Der Ziel
Organizations
- University of Minnesota