RESEARCH ON ANISOTROPY IN POLYCRYSTALLINE DIELECTRIC MATERIALS.

Abstract

This report covers the continuation of studies of dielectric anisotropy found in polycrystalline ceramic bodies. During this program, some of the mechanisms contributing to dielectric anisotropy were investigated. Specifically, these were: (1) preferred orientation of component crystals, (2) residual stresses in the crystal lattice, and (3) density gradients in the materials. X-ray diffraction techniques were used to characterize the materials in terms of preferred orientation and internal stress and these characteristics were correlated with the dielectric properties of those materials in order to evaluate the contributory effects of those characteristics to dielectric anisotropy. It was shown that preferred orientation was the major factor in dielectric anisotropy observed in ceramic bodies. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1966
Accession Number
AD0638450

Entities

People

  • Donald H. Rice
  • Richard W. Stowe

Organizations

  • Melpar

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Anisotropy
  • Bodies
  • Ceramic Bodies
  • Crystal Lattices
  • Crystals
  • Dielectric Properties
  • Dielectrics
  • Diffraction
  • Materials
  • Orientation (Direction)
  • Polycrystals
  • Residual Stress
  • Stresses
  • X Rays
  • X-Ray Diffraction

Readers

  • Materials Science and Engineering.
  • Systems Analysis and Design