TRANSISTOR QUALITY STATISTICS IN A PULSED IONIZING RADIATION ENVIRONMENT - T SUB SR.
Abstract
A statistical study was performed to establish prediction probability levels for the Hughes radiation-induced storage time (t sub sR) prediction technique as applied to worst-case circuit design and transistor quality control. One hundred ten (110) each of five (5) transistor types were employed in the study. The study shows that it is feasible to use this prediction technique to estimate the mean and upper spread limits of open-base radiation storage time, sub sR*, for individual device types. Hence, the technique can be employed in worst-case design procedures, in quality control and in device type selection. A procedure is given for predicting a t sub SR* distribution, for a large transistor batch, form the measured high-current electrical storage (t sub s) distribution and statistical parameters obtained from small sample (e.g., 10 - 15 units) radiation measurements. According to standard statistical tests, the distribution predictions exhibit high confidence (90 - 95%) for radiation rates significantly greater than that required for marginal saturation. Additionally, a nomograph prediction method is presented which provides estimates of t sub sR* means and spread limits based completely upon electrical measurements. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1966
- Accession Number
- AD0638862
Entities
People
- K. R. Walker
Organizations
- Hughes Aircraft Company