THE SELECTION OF FAILURE LOCATION TESTS BY PATH SENSITIZING TECHNIQUES,

Abstract

A method of deriving test sequences that utilizes path sensitizing techniques is presented. The tests are designed to locate (diagnose) faults in combinational logic networks. The basic strategy is to pick a fault to be tested and sensitize paths, some of which go through the fault. A path is sensitized if the associated test checks for faults along the path; therefore the main objective is to find a set of tests which will determine if the fault has occurred. The proposed method of test selection is compared to other techniques in current use and is shown to produce at least as good a set of tests as the others give even though the path sensitizing method uses less time or less computer memory space. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1966
Accession Number
AD0640462

Entities

People

  • David R. Howarter

Organizations

  • University of Illinois Urbana–Champaign

Tags

DTIC Thesaurus Topics

  • Circuits
  • Computers
  • Computing Devices
  • Electrical Circuits
  • Electrical Equipment
  • Electronic Circuits
  • Logic
  • Logic Gates
  • Networks
  • Sequences

Readers

  • Instructional Design and Training Evaluation.
  • Rocket Propulsion.
  • Seismology

Technology Areas

  • Space
  • Space - Spacecraft Maneuvers