PRODUCTION ENGINEERING MEASURE FOR SILICON NPN SWITCHING TRANSISTORS.

Abstract

Areas of progress during the quarter were as follows: (1) Evaluation of decreased substrate resistivity initiated. (2) Evaluation of increased breakdown voltage range initiated. (3) Tests of increased diffusion source time completed. (4) Evaluation probe measurements reviewed and standardized. (5) New emulsion developer installed. (6) Evaluation of photoresist coating thickness versus spin velocity completed. (7) Refined oxide etching techniques. (8) Preliminary evaluation of centrifuged KMER completed. (9) Investigation of metallization thicknesses versus pattern definition initiated. (10) Evaluation of experimental header capacitances completed. (11) All testing completed on Engineering Sample No. 1 units. (12) Engineering Sample No. 2 units delivered to the customer. (Author)

Document Details

Document Type
Technical Report
Publication Date
Feb 25, 1966
Accession Number
AD0640484

Entities

People

  • Jack Freese
  • Mark Siegel

Organizations

  • Motorola Mobility

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Capacitance
  • Coatings
  • Diffusion
  • Emulsions
  • Engineering
  • Measurement
  • Photoresist Coatings
  • Production
  • Production Engineering
  • Production Management Methods
  • Productivity
  • Substrates
  • Switching
  • Test And Evaluation
  • Thickness

Readers

  • Aerospace Test and Evaluation
  • Nanofabrication and Microfabrication.
  • Semiconductor Device Technology