PRODUCTION ENGINEERING MEASURE FOR SILICON NPN SWITCHING TRANSISTORS.

Abstract

Areas of progress during the quarter were as follows: (1) Incoming material specification change to substrate resistivity of 0.01 to 0.02 ohm/cm and breakdown voltage range of 80 to 100 volts has been approved and specifications issued. (2) New diffusion experiments to test narrower basewidths have been initiated. (3) Evaluation probe limits were adjusted and specifications issued. (4) New 10-mil-mask evaluation has been initiated. (5) A new Motorola photoresist is now under evaluation. (6) The cause of stress failures in environmental testing has been determined and appropriate measures were initiated to eliminate the failure mode. (7) Metallization amounts have been standardized and specifications issued. (8) A new cascade rinse facility is now in production use. (Author)

Document Details

Document Type
Technical Report
Publication Date
May 25, 1966
Accession Number
AD0640894

Entities

People

  • Jack Freese
  • Mark Siegel

Organizations

  • Motorola Mobility

Tags

DTIC Thesaurus Topics

  • Buildings And Structures
  • Diffusion
  • Engineering
  • Failure Mode And Effect Analysis
  • Materials
  • Production
  • Production Engineering
  • Production Management Methods
  • Productivity
  • Specifications
  • Substrates
  • Switching
  • Test And Evaluation
  • Transistors

Readers

  • Environmental Engineering.
  • Facility/Structural Engineering.
  • Semiconductor Device Technology