EVALUATION OF THIN-FILM RESISTORS AND CROSSOVERS.
Abstract
The report describes various experiments performed on thin-film resistor and crossover networks which were vacuum deposited on glass substrates using silicon monoxide, cermet, copper, and chromium deposition materials. Test results are discussed from both an engineering and statistical point of view. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 15, 1966
- Accession Number
- AD0640933
Entities
People
- John Paulus
Organizations
- Naval Air Warfare Center, Indianapolis