SURFACE OXIDE FILMS AND THE LIFE TIME OF VACANCIES IN THIN CRYSTALS,

Abstract

During annealing experiments in the electron microscope, prismatic dislocation loops and helices have been observed to grow in thin foils prepared from quenched and aged samples of supersaturated aluminum-magnesium alloys. Growth in pure aluminum or dilute aluminum-magnesium alloys has not been reported. It has been suggested recently that the excess vacancies required for growth are residual quenched-in vacancies which were not able to sink at external surfaces due to the presence of an impervious oxide film. The oxide mechanism fails to account for the fact that growth has not been observed in pure aluminum and dilute aluminum alloys. This point and others concerning the life time of vacancies in thin crystals are discussed. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1966
Accession Number
AD0641126

Entities

People

  • A. Eikum
  • Gray C. Thomas

Organizations

  • Boeing

Tags

DTIC Thesaurus Topics

  • Alloys
  • Aluminum
  • Aluminum Alloys
  • Electron Microscopes
  • Films
  • Magnesium
  • Magnesium Alloys
  • Microscopes
  • Oxide Films
  • Oxides

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Surface Engineering/Surface Coating Technology.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene