ELECTRON DIFFRACTION STUDIES AT ELEVATED TEMPERATURES.
Abstract
When a sample under investigation is illuminated by parallel rays, and suitable lenses are available for the radiation used, the resulting scattering (i.e. diffraction) pattern can be focused onto a plane. Then the spacing of the diffraction maxima and minima is determined by the characteristics of the projection lens and is independent of the location of the sample. An electron diffraction apparatus for gases operating on this principle is not limited by the loss of resolution due to sample spread, nor by the departure of the photographic plate from the focal sphere, as are units of conventional design. An apparatus built on the parallel incidence principle has features which are particulatly advantageous for samples which are available at low densities only, and for studies of surface reflections at grazing incidence. The author reports that during the past year the apparatus under construction since 1963, was brought into operation, and demonstrated that the apparatus operates essentially as predicted.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1966
- Accession Number
- AD0641659
Entities
People
- Simon H. Bauer
Organizations
- Cornell University