STUDY OF EFFECT OF HIGH-INTENSITY PULSED NUCLEAR RADIATION ON ELECTRONIC PARTS AND MATERIALS (SCORRE)
Abstract
The report describes the radiation-induced behavior of tantalum-oxide, mica, ceramic, Mylar, glass, and polystyrene capacitors using results obtained at several sources. Also included are discussions of the following: Experimental techniques at each radiation source, including measurement of circuits, components, dosimetry, and variation of circuit and radiation parameters; Results from SPRF, LINAC, and AFXR tests describing the dependences of the induced current for the irradiated dielectric; Interpretation of these results in terms of appropriate models and radiation and circuit parameters; Comparison of the effects observed at each irradiation source; Description of the tests on magnetics and the test results. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1966
- Accession Number
- AD0641673
Entities
People
- Frank A. Frankovsky
- Gilbert E. Boyd
- Paul G. Boczar
- Wayne A. Cordwell
Organizations
- International Business Machines Corporation (Armonk, NY)