STUDY OF EFFECT OF HIGH-INTENSITY PULSED NUCLEAR RADIATION ON ELECTRONIC PARTS AND MATERIALS (SCORRE)

Abstract

The report describes the radiation-induced behavior of tantalum-oxide, mica, ceramic, Mylar, glass, and polystyrene capacitors using results obtained at several sources. Also included are discussions of the following: Experimental techniques at each radiation source, including measurement of circuits, components, dosimetry, and variation of circuit and radiation parameters; Results from SPRF, LINAC, and AFXR tests describing the dependences of the induced current for the irradiated dielectric; Interpretation of these results in terms of appropriate models and radiation and circuit parameters; Comparison of the effects observed at each irradiation source; Description of the tests on magnetics and the test results. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1966
Accession Number
AD0641673

Entities

People

  • Frank A. Frankovsky
  • Gilbert E. Boyd
  • Paul G. Boczar
  • Wayne A. Cordwell

Organizations

  • International Business Machines Corporation (Armonk, NY)

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Capacitors
  • Dielectric Polymers
  • Dielectrics
  • Dose Rate
  • Dosimetry
  • Electronic Components
  • Failure Mode And Effect Analysis
  • Ferrites
  • Gamma Rays
  • Linear Accelerators
  • Magnetic Devices
  • Materials
  • Measurement
  • Nuclear Radiation
  • Radiation
  • Radiation Effects
  • X Rays

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Nuclear and Radiation Engineering.

Technology Areas

  • Microelectronics