RELIABILITY SCREENING USING INFRARED RADIATION.
Abstract
A program was conducted to determine the feasibility of developing a process whereby transistors which have a high probability of failing during their lifetime can be screened from a lot of similiar but reliable transistors on the basis of their infrared output while operating under normal electrical conditions. The report includes discussions of the mode of operation of the infrared instrumentation used in the program and details of the life tests which were conducted. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1966
- Accession Number
- AD0642112
Entities
People
- Bernard Selikson
- Joseph Dimauro
Organizations
- Sylvania Electric Products