TRANSMISSION ELECTRON MICROSCOPY OF THIN GLASS SAMPLES.

Abstract

Two techniques for preparing thin glass samples for direct transmission electron microscopy, viz. mechanical thinning and fracturing are discussed. A modification of the Doherty and Leombruno procedure for mechanically thinning ceramic materials is described. These techniques make possible more reliable electron microscope studies of fine scale submicrostructure in glass systems. Electron microscope observations on fused silica, an alkali-borosilicate glass, and some binary silicate glasses are reported and discussed in terms of our present understanding of glass structure. (Author)

Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1966
Accession Number
AD0643229

Entities

People

  • D. R. Uhlmann
  • D. Turnbull
  • G. R. Pierce
  • T. P. Seward

Organizations

  • Harvard University

Tags

DTIC Thesaurus Topics

  • Ceramic Materials
  • Electron Microscopes
  • Electron Microscopy
  • Electrons
  • Materials
  • Microscopes
  • Microscopy
  • Optical Materials
  • Transmission Electron Microscopy

Fields of Study

  • Materials science

Readers

  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene