PRODUCTION ENGINEERING MEASURE (PEM) FOR SILICON MIXER DIODE.
Abstract
The fourth engineering test sample run has been initiated using the new package design, an improved tungsten whisker and a welded end seal. Tests have shown that the granular structure of the ceramic must be controlled if the package is to exhibit the desired mechanical characteristics. Step stress analysis of storage life test data on units from the third run show a failure rate of 0.03% per 1000 hours compared to the objective 0.001% level.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 30, 1966
- Accession Number
- AD0643267
Entities
People
- C. Brunquell
- G. Bowne
- R. Bayliss
Organizations
- Sylvania Electric Products