OPTICAL PROPERTIES OF METALS AND SEMICONDUCTING MATERIALS.

Abstract

Theory of electrical and optical properties of conducting media is reviewed. Properties of thin films (thickness less than 200 angstroms) are shown to be affected by reduction of the mean free path of an electron by the boundaries of the film. Changes in properties by lattice imperfections or impurities are traced to incorrect preparation of films. A program is outlined to enlarge understanding of metals and semiconductors by investigation of films prepared by ultrahigh-vacuum techniques. Boundary effects, surface phenomena, and consideration of lattice defects and impurities are included. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 22, 1966
Accession Number
AD0643755

Entities

People

  • T. G. Pavlopoulos

Organizations

  • Navy Electronics Laboratory

Tags

DTIC Thesaurus Topics

  • Advanced Materials
  • Boundaries
  • Compound Semiconductors
  • Electronics
  • Electrons
  • Engineered Materials
  • Films
  • Impurities
  • Materials
  • Mean Free Path
  • Optical Properties
  • Plasmonic Materials
  • Semiconductors
  • Solid State Electronics
  • Thin Films
  • Ultrahigh Vacuum

Readers

  • Systems Analysis and Design
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene