RADIATION BACKSCATTERING AND RADIATION-INDUCED X-RAYS FOR MEASURING SURFACE COMPOSITION AND STRUCTUR

Abstract

The use of promethium-147 beta backscattering to measure the thickness of plastic coatings on copper was determined. Backscattering radiation was also used to determine the structure and surface composition of copper specimens. A preliminary study of the use of beta-particle backscattering and beta-particle-induced X-rays for measuring corrosion is described.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1966
Accession Number
AD0643858

Entities

People

  • Sigmund Berk

Tags

Communities of Interest

  • Energy and Power Technologies
  • Space

DTIC Thesaurus Topics

  • Backscattering
  • Beta Particles
  • Chemistry
  • Classification
  • Corrosion
  • Detectors
  • Elements
  • Films
  • Materials
  • Metals
  • Particles
  • Promethium
  • Radiation
  • Scattering
  • Security
  • Thickness
  • X Rays

Fields of Study

  • Physics

Readers

  • Nuclear and Radiation Engineering.
  • Solar Physics
  • Surface Engineering/Surface Coating Technology.