PRINCIPLE OF THE DYNAMIC X-RAY DIFFRACTION TECHNIQUE

Abstract

A mathematical analysis is made of data obtained by the dynamic x-ray diffraction technique. It is shown how by measuring the integrated diffraction intensity over a given interval of the strain cycle and accumulating results over many cycles of strain, the portion of the change in diffracted intensity which is in phase (delta I') and out of phase (delta I'') with the applied sinusoidal strain may be obtained. The means for separating contributions of overlapping crystalline and amorphous peaks is discussed as is the determination of the dynamic orientation function by graphical integration of the change in diffracted intensity with azimuthal angle.

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1966
Accession Number
AD0644029

Entities

People

  • Tatsuro Kawaguchi

Organizations

  • University of Massachusetts Amherst

Tags

Communities of Interest

  • Air Platforms

DTIC Thesaurus Topics

  • Amplitude
  • Bragg Angle
  • Coherent Scattering
  • Diffraction
  • Distribution Functions
  • Equations
  • Incoherent Scattering
  • Intensity
  • Military Research
  • Numbers
  • Operating Systems
  • Orientation (Direction)
  • Scattering
  • Thickness
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Physics

Readers

  • Control Systems Engineering.
  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Mathematics or Statistics