RELIABILITY IN MICROELECTRONICS,

Abstract

The paper reviews the current and anticipated future reliability requirements for microelectronic devices and compares these to the present reliability levels. The 'quality problem' as it affects reliability is discussed in some detail. Data is derived from various equipment development programs and investigations of integrated circuit quality and reliability. In recognition of the fact that the produce (microelectronic devices) does not yet meet the 'promise,' some of the problems and interim solutions are discussed in detail. The effectiveness of various acceptance and screening procedures for integrated circuits is evaluated. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1966
Accession Number
AD0644195

Entities

People

  • Joseph B. Brauer

Organizations

  • Rome Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Circuit Testers
  • Circuits
  • Electrical Circuits
  • Electrical Equipment
  • Electronic Circuits
  • Electronic Equipment
  • Integrated Circuits
  • Microelectronics
  • Modules (Electronics)
  • Recognition
  • Reliability
  • Test Equipment

Fields of Study

  • Engineering

Readers

  • Integrated Circuit Design and Technology.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics