MICROELECTRONIC STUDIES, TASK 1. FEASIBILITY STUDY OF EMPIRICAL SCREENING METHODS, TASK 2. MODELING OF TRANSIENT BEHAVIOR.

Abstract

Screening techniques were studied which were potentially useful for silicon integrated circuits. Based on experiments with simple NOR gates, parameters measuring low-frequency noise and transfer characteristics appear to be feasible. Certain transient parameters were developed and studied for potential screening. The purpose was to extend the parameters to another type of circuit and determine whether a correlation existed between assumed changes in the internal parameters of a NOR gate and resulting changes of the 'characteristic parameters.' (Author)

Document Details

Document Type
Technical Report
Publication Date
Mar 25, 1966
Accession Number
AD0644198

Entities

People

  • A. B. Timberlake
  • B. C. Peralta
  • C. G. Kopp
  • J. L. Easterday
  • J. W. Klapheke

Organizations

  • Battelle Memorial Institute

Tags

DTIC Thesaurus Topics

  • Circuits
  • Electrical Circuits
  • Electrical Equipment
  • Electronic Circuits
  • Electronic Equipment
  • Electronics
  • Feasibility Studies
  • Frequency
  • Integrated Circuits

Readers

  • Electrical Engineering
  • Instructional Design and Training Evaluation.
  • Plasma Physics / Magnetohydrodynamics

Technology Areas

  • Microelectronics