THIN-FILM SHIELDING TECHNIQUE.
Abstract
A test instrument and measurement technique was devised to study the electromagnetic shielding properties of vacuum-deposited thin metallic films for applications in microelectronic circuitry and equipments. The test procedure is described, design information for the construction of the test device is given, and a theoretical basis for its use is presented. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 1966
- Accession Number
- AD0645139
Entities
People
- Robert A. Weck
Organizations
- United States Army Communications-Electronics Command