THIN-FILM POLYCRYSTALLINE FIELD-EFFECT TRIODE.

Abstract

Life test data are presented on thin-film transistors which have been on load life test for over 2,000 hours. Some of the problems associated with the masking technique used to fabricate the four-input NOR/OR gate circuit are discussed. Testing procedures to be used to evaluate the circuit are discussed in detail. Some of the test data on the initial circuits fabricated are presented. (Author)

Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1966
Accession Number
AD0645262

Entities

People

  • A. K. Rapp
  • J. J. Fabula
  • M. L. Topfer
  • R. L. Schelhorn

Tags

DTIC Thesaurus Topics

  • Active Electronic Components
  • Electronic Components
  • Electronic Equipment
  • Electronics
  • Field Effect Transistors
  • Films
  • Life Tests
  • Polycrystals
  • Semiconductor Devices
  • Thin Film Transistors
  • Thin Films
  • Transistors

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Systems Analysis and Design