STUDY OF THE PROPERTIES OF VARIABLE CAPACITANCE: SEMICONDUCTOR DEVICES.

Abstract

Contents: PIN Characterization Studies-Frequency Division; Frequency Conversion by a P(+)-N-N(+) Structure Having a Varying Impurity Atom Concentration; Tunneling in MOS-Structures.

Document Details

Document Type
Technical Report
Publication Date
Oct 31, 1966
Accession Number
AD0645299

Entities

People

  • Daniel Leenov
  • Walter E. Dahlke

Organizations

  • Lehigh University

Tags

DTIC Thesaurus Topics

  • Capacitance
  • Compound Semiconductors
  • Conversion
  • Electronics
  • Frequency
  • Frequency Conversion
  • Impurities
  • Quantum Tunneling
  • Semiconductor Devices
  • Semiconductors
  • Solid State Electronics
  • Tunneling

Readers

  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene