PRODUCTION ENGINEERING MEASURE: HIGH SPEED SEMICONDUCTOR SWITCH (TWO TERMINAL) AND HIGH SPEED SEMICONDUCTOR SWITCH (GATE).

Abstract

The report presents the results obtained from quality control testing of the three-terminal device, the results of investigating the curing procedures for the two-terminal and 2N1765 devices, and the evaluation of wafer resistivity and thickness for optimum turn-on time of the 2N1765 device. (Author)

Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1966
Accession Number
AD0645480

Entities

People

  • Jerry Bravo

Organizations

  • Motorola Mobility

Tags

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Electronics
  • Engineering
  • Production
  • Production Engineering
  • Production Management Methods
  • Productivity
  • Quality Control
  • Semiconductors
  • Solid State Electronics
  • Standards
  • Terminals
  • Test And Evaluation
  • Thickness

Fields of Study

  • Materials science

Readers

  • Electrical Engineering
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene
  • Microelectronics - Microelectromechanical Systems