A BAYESIAN MODEL FOR TROUBLESHOOTING ELECTRONIC EQUIPMENT.

Abstract

Bayes' Theorem is applied to the problem of formulating an optimum strategy for the troubleshooting of equipment failures. The probabilities attaching to hypotheses about the various possible causes of system failure are modified according to the theorem, and the process of testing and replacing components is structured so as to minimize the expected total cost of system restoration. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 09, 1966
Accession Number
AD0645577

Entities

People

  • M. Freitag
  • R. L. Hershman

Organizations

  • Navy Electronics Laboratory

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Bayesian Networks
  • Electronic Equipment
  • Hypotheses
  • Mathematics
  • Models
  • Probabilistic Models
  • Probability
  • Troubleshooting

Fields of Study

  • Engineering

Readers

  • Artificial Intelligence
  • Systems Analysis and Design

Technology Areas

  • AI & ML
  • AI & ML - Bayesian Inference
  • Microelectronics
  • Microelectronics - Microelectromechanical Systems