IMPROVED HIGH-SPEED INFRARED MAPPING FOR RELIABILITY ASSESSMENT OF MICROCIRCUITRY.
Abstract
Describes modifications to equipment and improved capability in IR mapping since first-generation system described in NEL Report 1272. High-resolution test mappings were successfully made at map-to-object magnifications up to 144x, in 3 minutes, and at environmental temperatures of 45 C to 55 C. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1966
- Accession Number
- AD0645664
Entities
People
- H. F. Dean
Organizations
- Navy Electronics Laboratory