EXPERIMENTS ON THE APPLICATION OF ELECTRON SCATTERING TO PLASMA DIAGNOSTICS,

Abstract

An experimental apparatus was constructed to test the concept of using Coulomb scattering of injected electron beams as a plasma diagnostic technique. The experimental conditions were chosen to avoid multiple scattering and plasma oscillation coupling with the beam insofar as possible. The data obtained indicated that these effects were avoided and that the single Coulomb-Rutherford collision model was the proper one for describing the results over the range of electron densities investigated. Extensive validation experiments were conducted to insure sufficient accuracy of Langmuir probe measurements, which were used for comparison purposes, and the absence of any spurious effects which could influence the beam scattering measurements. Theoretical values of cross-sections were derived by averaging the Rutherford results over the length of the interaction zone and over the width of the beam, using experimental data for spatial charge distribution and beam intensity profiles. These values were within 15 percent of the experimentally measured cross-sections. The influence of detector angular resolution and beam energy were also measured and found to be in good agreement with Rutherford theory. It was concluded that it is indeed feasible to use an electron beam for plasma diagnositics. (Author)

Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1966
Accession Number
AD0646611

Entities

People

  • E. L. Battle

Organizations

  • University of Toronto

Tags

DTIC Thesaurus Topics

  • Accuracy
  • Collisions
  • Detectors
  • Electron Beams
  • Electron Density
  • Electron Scattering
  • Electrons
  • Experimental Data
  • Langmuir Probes
  • Measurement
  • Oscillation
  • Plasma Diagnostics
  • Plasma Oscillation
  • Scattering
  • Spurious Effects

Fields of Study

  • Physics

Readers

  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Plasma Physics.

Technology Areas

  • Directed Energy
  • Microelectronics