EFFECTIVE MASS OF FREE CARRIERS IN SEMICONDUCTORS AS DETERMINED FROM INFRARED REFLECTIVITY MEASUREMENTS,

Abstract

Methods are reviewed by which free carrier effective masses of semiconductors are determined from measurements of the infrared reflectivity at normal incidence. This effective mass is referred to as the electric susceptibility mass, (m sub s). The theory upon which the measurements are based is developed. Relationships between (M sub s) and various types of electronic band structure are discussed in considerable detail. Several examples are presented which illustrate the usefulness of such measurements in studying the basic electronic properties of semiconductors. (Author)

Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1967
Accession Number
AD0650867

Entities

People

  • Jack R. Dixon

Organizations

  • Naval Ordnance Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Band Structures
  • Compound Semiconductors
  • Electronics
  • Energy Bands
  • Measurement
  • Physical Properties
  • Reflectivity
  • Semiconductors
  • Solid State Electronics
  • Solid State Properties

Readers

  • Semiconductor Device Technology
  • Spectroscopy.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene