THIN-FILM POLYCRYSTALLINE FIELD-EFFECT TRIODE.

Abstract

During this report period, a change in the circuit to be worked on was made. The problems associated with the four-input NOR/OR gate circuit described in the First Quarterly Report have persisted, which has led to the temporary abandonment of this circuit. In its place, work on a complementary three-input NAND gate circuit was initiated. Much better results were achieved with this circuit. Twenty-four of these circuits were delivered to Fort Monmouth for evaluation. Life test data on thin-film transistors that have recently been put on life is presented. Test data on the delivered circuits is presented also. (Author)

Document Details

Document Type
Technical Report
Publication Date
May 01, 1967
Accession Number
AD0651816

Entities

People

  • A. H. Danis
  • A. K. Rapp
  • M. L. Topfer
  • R. L. Schelhorn

Tags

DTIC Thesaurus Topics

  • Circuits
  • Electronic Equipment
  • Films
  • Life Tests
  • Nand Gates
  • Polycrystals
  • Test And Evaluation
  • Thin Film Transistors
  • Thin Films
  • Transistors

Readers

  • Educational Psychology
  • Integrated Circuit Design and Technology.
  • Technical Research and Report Writing.