LASER DAMAGE STUDY OF THIN FILMS
Abstract
A concentrated effort was made, during the fourth quarterly period, to increase the laser damage threshold, E sub t, of aluminum oxide films. This objective was approached empirically. Selected vacuum deposition parameters were varied and the effect on E sub t was observed. E sub t for one-quarter wavelength and thirty-three quarter wavelengths films were increased by a factor of two over previously reported values. The one-half wavelength threshold was increased by a factor of six over the previous value. The one-quarter wavelength threshold spontaneously fell to half its original value two days after manufacture.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 01, 1967
- Accession Number
- AD0651988
Entities
People
- Arthur F. Turner
- Stanley J. Refermat