EQUIPMENT ON SEMICONDUCTORS AND METHOD OF RADIO WAVE MAPPING,

Abstract

The practical value and promising outlook of using radio wave mapping for geological surveys is quite apparent and the necessity of introducing this method is obvious. The PINP-1 and PINP-1M semiconductor field intensity meters are used for this purpose. The latest version of this meter, the PINP-2, is examined. The conditions under which these meters operate are considered and details are given on their performance. (Author)

Document Details

Document Type
Technical Report
Publication Date
Mar 17, 1967
Accession Number
AD0652468

Entities

People

  • A. D. Frolov

Organizations

  • National Air and Space Intelligence Center

Tags

DTIC Thesaurus Topics

  • Carbides
  • Chemical Compounds
  • Compound Semiconductors
  • Electronic Equipment
  • Electronics
  • Geological Surveys
  • Inorganic Carbon Compounds
  • Inorganic Chemicals
  • Intensity
  • Modules (Electronics)
  • Radio Waves
  • Semiconductor Devices
  • Semiconductors
  • Solid State Electronics
  • Surveys

Readers

  • Astronomy and Astrophysics.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics