THIN-FILM POLYCRYSTALLINE FIELD-EFFECT TRIODE.
Abstract
The report contains work on the complementary three-input NAND gate circuit. Twelve additional circuits were delivered to Fort Monmouth for evaluation. A new set of masks was designed for this circuit which will lead to improved performance and frequency response. Life test data that have been accumulated for almost three thousand hours are presented. Test data on the delivered circuit are also presented. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1967
- Accession Number
- AD0652885
Entities
People
- A. H. Danis
- A. K. Rapp
- M. L. Topfer