THE INVESTIGATION OF SILICON CARBIDE BY A TRAVELLING SOLVENT METHOD.

Abstract

The crystallization of SiC from molten alloy mixtures of Cr-SiC, Cr5-Si3-SiC, and CrSi2-SiC of varying compositions was investigated. The resulting crystals were analyzed for their polytype structure and crystal morphology. Cubic (beta) SiC was obtained preferably from dilute solutions in molten Cr5Si3 when rapidly cooled. The amount of alpha-SiC increased for slower cooling rates; it was also greater for the other alloy mixtures. Structure identification was achieved by X-ray precession methods and by crystal morphology analysis. Etching in ClF3 gas at 400 C was used for the determination of polarity of SiC deposited from either molten alloy or from CH3SiCl3-H2 gaseous mixtures. This etch proved superior to previously used conventional etches in surface and dislocation studies. Epitaxial deposition was studied in detail with respect to substrate influence and structure propagation. Considerations on the crystal growth mechanism and on necessary requirements as dictated by morphology conditions are presented. It is stated that crystal growth and desired polytype formation can be well monitored by proper control of growth conditions as derived from morphology considerations, if it can be done at all. (Author)

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1967
Accession Number
AD0654305

Entities

People

  • B. N. Das
  • G. A. Wolff

Tags

DTIC Thesaurus Topics

  • Carbides
  • Compound Semiconductors
  • Crystal Growth
  • Crystallization
  • Crystals
  • Dislocations
  • Identification
  • Polarity
  • Precession
  • Silicon
  • Silicon Carbide
  • Substrates
  • X Rays

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Semiconductor Device Technology
  • Systems Analysis and Design